学科分类
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500 个结果
  • 简介:首次提出在Ni中掺入夹层W的方法来提高NiSi的热稳定性。具有此结构的薄膜,经600-800℃快速热退火后,薄层电阻保持较低值,小于2Ω/。经Raman光谱分析表明,薄膜中只存在NiSi相,而没有NiSi2生成。Ni(W)Si的薄层电阻由低阻转变为高阻的温度在800℃以上,比没有掺W的镍硅化物转变温度的上限提高了100℃。Ni(W)Si/Si肖特基势垒二极管能够经受650-800℃不同温度的快速热退火,肖特基接触特性良好,肖特基势垒高度为0.65eV,理想因子接近于1。

  • 标签: Ni(W)Si 热稳定性 肖特基势垒二极管 XRD RAMAN光谱 卢瑟福背散射
  • 简介:AwedgeshapeSiLEDisdesignedandfabricatedwith0.35μmdouble-gratingstandardCMOStechnology.ThedevicestructureisbasedontheN-well-P+junction.TheP+hasawedgeshapeandissurroundedbytheN-well.ThemicrographsofSiLEDs'emittingandlayoutarecaptured.TheI-VcharacteristicandspectraoftheSiLEDaretested.Underroomtemperatureandbackwardbias,itsradiantluminosityis12nWat100mA,andthewavelengthoftheemittingpeakislocatedat764nm.

  • 标签: 硅发光二极管 CMOS技术 标准 设计 制造 微米技术
  • 简介:Cupricoxide(CuO)isconsideredtobeapromisingmaterialforphotovoltaicapplications.Inthispaper,p-CuO/n-Sijunctionsolarcellswereobtainedbythermaloxidationofmetalliccopperfilmsdepositedonn-Sisubstratesat400℃for5h.X-raydiffractionpatternsshowthattheas-preparedfilmsareCuOwithmonocliniccrystallinestructure.HalleffectmeasurementresultsshowthatCuOfilmsarep-typeconduction.Adirectband-gapof~1.57eVfortheCuOfilmisdeducedfromUV-VisAbsorbancespectra.SolarcellsofCu/p-CuO/n-Si/AlstructureshowthatitsphotovoltaicbehaviorhasamuchwiderspectrumresponsewidthcomparedwiththatofSisolarcells.Inaddition,thephotocurrentofCuO/n-SijunctionisinvestigatedasafunctionofCuOfilmthickness,anditisfoundthatthecriticalthicknessforCuOonSiisabout250nm.

  • 标签: 硅太阳能电池 制备 结特性 X射线衍射分析 异质 制造
  • 简介:华硕系列笔记本中有12.1寸的轻薄型机器S5N、M5N,有15寸宽屏幕的M6N,在迷你领域有10寸屏幕的S200N,那么既兼顾移动性,又兼顾性能的14寸屏幕领域呢?对了,就是这款M3N了。

  • 标签: ASUS公司 笔记本电脑 M3N 外观设计 配置 性能
  • 简介:UsingdoublecrystalX-raysdiffraction(DCXRD)andatomicforcemicroscopy(AFM),theresultsofGexSi1-xgrownUHV/CVDfromSi2H6andSiH4areanalyzedandcompared.Adsorbatescanmigratetotheenergy-favoringpositionduetotheslowgrowthratefromSiH4.Inthiscase,aSibufferthatisolatestheeffectofsubstrateonepilayercouldnotbegrown,whichresultsinapitpenetratingintoepilayerandbuffer.TheFWHMis0.055°inDCXRDfromSiH4.Thepresenceofdiffractionfringesisanindicationofanexcellentcrystallinequality,TheroughnessofthesurfaceisimprovedifgrownbySi2H6:however,thecrystalqualityoftheGex2Si1-xmaterialbecameworsethanthatfromSiH4duetomuchlargergrowthratefromSi2H6.ThecontentofGeisobtainedfromDCXRD,whichindicatesthegrowthratefromSi2H6islargest,thenGeH4andthatfromSiH4isleast.

  • 标签: 硅化锗 半导体材料 化学气相沉积
  • 简介:Afast-speedpulsedetectorbasedonn-typeSi-Schottkydiodemountedinthewaveguideisinvestigated.Therelationofthefast-speedpulsedetectorbetweenresponsetimeand3dBbandwidthisanalyzed.Byadoptingthetunablecircuit,thematchedbandwidthisachievedaswideaspossible.Experimentalresultsshowthatthepulseresponsetimeofthedetectorislessthan150pswithinrandomcarriersignal500MHzbandwidthrangebetween35GHzto39GHzviatuningcircuit.Thedetectorisveryeasytooperatebecauseitdoesnotneedbiascurrentorsynch-pulsesource.

  • 标签: 高速脉冲 调谐电路 检测器 电路基础 肖特基 N型硅
  • 简介:在这项工作中,和两个新的荧光粉发光特性的合成:Pr3+CaYAlO4(CYA)和镨铽:CyA的发光二极管(LED)的影响。0.5%(原子百分比)Pr3+:环孢素A具有最大的亮黄色发射不同Pr3+浓度,根据3P0+3H4→1G4+1G4的交叉弛豫过程。Pr3+的能级图:环孢素A,特别是D级和4F51S0能级位置,讨论了。通过掺杂Tb3+离子,镨铽荧光粉的色坐标:CyA可调谐从黄色到白色区域。最后,用最强的发光色坐标(0.339,0.364)位于白色区可在0.3%Tb3+/0.5%Pr3+:CyA磷。

  • 标签: 白光发射 肺结核 公关 发光特性 环孢素A
  • 简介:王博士“电子组装工艺缺陷的分析诊断与解决”一、前言:目前中国已经成为全球电子制造业的中心,随着电子产品的高密化、环保化、低利润化、高质量要求,电子制造企业的生存越来越艰难,只有在保证产品功能的情况下提高产品质量、降低产品成本,才能在竞争激烈的市场中争得一席之地。

  • 标签: 培训 电子组装 产品质量 电子制造业 工艺缺陷 电子产品
  • 简介:Anultrahighvacuumchemicalvapordeposition(UHV/CVD)systemisintroduced.SiGealloysandSiGe/Simultiplequantumwells(MQWs)havebeengrownbycold-wallUHV/CVDusingdisilane(Si2H6)andgermane(GeH4)asthereactantgasesonSi(100)substrates.ThegrowthrateandGecontentsinSiGealloysarestudiedatdifferenttemperatureanddifferentgasflow.ThegrowthrateofSiGealloyisdecreasedwiththeincreaseofGeH4flowathightemperature.X-raydiffractionmeasurementshowsthatSiGe/SiMQWshavegoodcrystallinity,sharpinterfaceanduniformity.Nodislocationisfoundintheobservationoftransmissionelectronmicroscopy(TEM)ofSiGe/SiMQWs.TheaveragedeviationofthethicknessandthefractionofGeinsingleSiGealloysampleare3.31%and2.01%,respectively.

  • 标签: GESI 量子阱 UHV/CVD 透射电子显微镜
  • 简介:TheinvestigationonopticalpropertiesofSi1-xGex/Sistrainedlayerstructureshasbeencarriedoutactivelyinrecentyears.Thephotoluminescencehasbe-comeabriskersubjectinthestudiesofitsvariousopticalproperties.Aresearchdevelop-menttophotoluminescencepropertiesofsomenewSi1-xGex/Sistrainedlayerstruc-turesisintroduced.

  • 标签: 应变层超点阵 光致发光 光电子器件 量子阱
  • 简介:Theoptimumparametersarecalculatedbythelargecross-sectiontheoryandmodecut-offequation.Theeffectonreversebiasvoltagesinanalysedbythedopingconcentrationinn^+-Si.Theissignificantbecausethereversebiasincreasessharplywhenthedopedconcentrationinn^+-Siislessthan1×10^20cm^-3.

  • 标签: 硅化锗 光检测器 波导
  • 简介:Theresidualelectricallyactivedefectsin(4×1012cm-2(30KeV)+5×1012cm-2(130KeV))si-implantedLECundopedsi-GaAsactivatedbytwo-steprapidthermalannealing(RTA)LABELEDAS970℃(9S)+750℃(12S)havebeeninvestigatedwithdeepleveltransientspec-troscopy(DLTS).TwoelectrontrapsET1(Ec-0.53eV,σn=2.3×10-16cm2)andET2(Ec-0.81eV,σn=9.7×10(-13)cm2)aredetected.Furthermore,thenoticeablevariationsoftrap’scon-centrationandenergylevelintheforbiddengapwiththedepthprofileofdefectsinducedbyionim-plantationandRTAprocesshavealsobeenobserved.The[Asi·VAs·AsGa]and[VAs·Asi·VGa·AsGa]areproposedtobethepossibleatomicconfigurationsofET1andET2,respectivelytoexplaintheirRTAbehaviors.

  • 标签: Si:GaAs Rapid thermal ANNEALING Ion IMPLANTATION
  • 简介:镓氮化物的大数量(轧)nanowires经由Ga2O3电影在一个石英试管在950点在氧化的铝层上扔了的ammoniating被准备了。当水晶的wurtzite由X光检查衍射,X光检查光电子spectrometry扫描电子显微镜和精选区域的电子衍射轧了,nanowires被证实了。传播电子显微镜(TEM)和扫描电子显微镜学(SEM)表明nanowires非结晶、不规则,与从30nm到直到十微米的80nm和长度的直径。精选区域的电子衍射显示有六角形的wurtzite结构的nanowire是单身者水晶。生长机制简短被讨论。

  • 标签: 纳米材料 氮化镓纳米线 氧化镓薄膜 氨人化 半导体材料 六边形纤锌矿结构
  • 简介:Organicmultiplequantumwells(OMQWs)consistingofalternatinglayersoforganicmaterialshavebeenfabricatedfromtris(8-hdroxyquinoline)aluminum(Alq)and2-(4-biphenylyl)-5-(4-tertbutylphenyl)-1,3,3-oxadiazole(PBD)byamultisource-typehigh-vacuumorganicmoleculardeposition.Fromthesmall-angleX-raydiffractionpatternsofAlq/PBDOMQWs,aperiodicallylayeredstructureisconfirmedthroughtheentirestack.TheAlqlayerthicknessintheOMQWswasvariedfrom1nmto4nm.Fromtheopticalaborption,photoluminescenceandelectroluminescencemeasurements,itisfoundthattheexcitonenergyshiftstohigherenergywithdecreasingAlqlayerthickness,ThechangesoftheexcitonenergycouldbeinterpretedastheconfinementeffectsofexcitonintheAlqthinlayers.Narrowingoftheemissionspectrumhasalsobeenobservedfortheelectroluminescentdevices(ELDs)withtheOMQWsstructureatroomtemperature.

  • 标签: 有机电发光器 有机多量子阱 有机半导体
  • 简介:PhotoconductivityCharacteristicsofPorousSi①CHAOZhanyun,WANGKaiyuan(DepartmentofElectronicEnginering,SoutheastUniversity,Nanji...

  • 标签: Metal/PS/Si/Al JUNCTION PHOTOCONDUCTIVITY POROUS Materials
  • 简介:随着4G牌照发放的临近,4G已成为当下业内的热点。不可否认4G是未来网络的发展趋势,但对于中国运营商而言,3G才是现金牛,所以充分发挥3G的潜力,不仅关系着运营商的当下,也决定着4G的未来。

  • 标签: 4G 3G 趋热 发展趋势 运营商
  • 简介:Lanthanidehasattractedmuchattentioninthefieldofopticalcommunicationsinrecentyears.SomepropertyanalysesonopticalwaveguideofNd-dopedcrystalNdxY1-xAl3(BO3)4andNd:MgO:LiNbO3aremadeinthispaper,followedbyintroductionofthemethodsofexperimentationandtheoreticalcalculationfortheplanaropticalwaveguides.Therefractiveindexprofilesoftheopticalwaveguidesareanalyzed.Theaboveworkoffersusefulinformationforstudyonnewtypematerialsforopticalcommunications.

  • 标签: 光波导 离子注入 折射率 集成光学
  • 简介:2008年ITU将开始进行4G标准的制定工作,ITU将开始向全世界征求4G候选技术。对4G的管制和研究已经成为全球范围的焦点,越来越多的人才和资金正在流入到该领域,4G技术的框架越来越清晰。从20世纪未4G概念的提出,到技术标准制动工作的启动。全球4G的发展已经走到了哪一步?本期特别策划围绕技术,频谱,标准,国际合作,未来应用等各方面,提示国际及国内4G研发的进程和关键问题。特别感谢未来移动通信论坛对本期专题的大力支持!

  • 标签: 4G技术 特征 聚集 技术标准 国际合作 全球范围
  • 简介:Aconductionchannelmodelispropsedtoexplainthehighconductivitypropertyofnc-Si:H.Detailedenergybanddiagramisdevelopedbasedontheanalysisandcalculation,andtheconductivityofthenc-Si:Hwasthenanalysedonthebasisofenergybandtheory.Itisassumedthattheconductivityofthenc-Si:Hstemsfromtwoparts:theconductanceoftheinterface,wherethetransportmechanismisidentifiedasathermal-assistedtunnelingprocess,andtheconductancealongthechannelaroundthegrain,whichmainlydeterminedthehighconductivityofthenc-Si:H.Theconductivityofnc-Si:Hiscalculatedandcomparedwiththeexperimentdata.Thetheoryisinagreementwiththeexperiment.

  • 标签: 传导率 能带图 片状晶体硅
  • 简介:在大约431nm的蓝光在C+培植以后从取向附生的硅被获得,在顺序蚀刻的氢环境和化学药品退火。随化学蚀刻的增加,蓝山峰起初被一座红山峰最后提高,然后减少了并且代替。C=O混合物在C+培植期间被介绍并且在纳米Si的表面嵌入在退火期间形成了,并且最后被形成纳米硅与嵌入结构,它贡献蓝排放。介绍是光致发光的可能的机制。

  • 标签: C^+种植 退火 化学侵蚀 植入结构