Strain Relaxation Related Photoluminescence Bands in Ge/Si Short Period Superlattices

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摘要 Pure-Ge/Sishortperiodsuperlattice(SPS)grownbygassourceMBE(GSMBE)isstudiedbyphotoluminescencespectroscopyandRamanscatteringspectroscopy.AnabnormalbandinphotoluminescenceisfoundinanintermediaterangeofLsibetween1.9nm-2.9nmforsampleswithLgefixedat1.5ml.Incontrasttoapure-Ge/Siquantumwell,theenergyofthebandshowsred-shiftasLsiincreases.RamanscatteringshowsthatSi-SivibrationrelatedRamanshiftreachesaminimumforsampleswithstrongestPLintensityoftheabnormalband.Itisthereforeconcludedthattheabnormalbandisrelatedwithstrainrelaxationprocess.
机构地区 不详
出版日期 1998年02月12日(中国期刊网平台首次上网日期,不代表论文的发表时间)
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