摘要
Pure-Ge/Sishortperiodsuperlattice(SPS)grownbygassourceMBE(GSMBE)isstudiedbyphotoluminescencespectroscopyandRamanscatteringspectroscopy.AnabnormalbandinphotoluminescenceisfoundinanintermediaterangeofLsibetween1.9nm-2.9nmforsampleswithLgefixedat1.5ml.Incontrasttoapure-Ge/Siquantumwell,theenergyofthebandshowsred-shiftasLsiincreases.RamanscatteringshowsthatSi-SivibrationrelatedRamanshiftreachesaminimumforsampleswithstrongestPLintensityoftheabnormalband.Itisthereforeconcludedthattheabnormalbandisrelatedwithstrainrelaxationprocess.
出版日期
1998年02月12日(中国期刊网平台首次上网日期,不代表论文的发表时间)