P-Type Nitrogen-Doped ZnO Films Prepared by In-Situ Thermal Oxidation of Zn3N2 Films

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摘要 P-typenitrogen-dopedZnOfilmsarepreparedsuccessfullybyin-situthermaloxidationofZn_3N_2films.Thepreparedfilmsarecharacterizedbyx-raydiffraction,non-Rutherfordbackscattering(non-RBS)spectroscopy,xrayphotoelectronspectroscopy,andphotoluminescencespectrum.TheresultsshowthattheZn_3N_2filmsstarttotransformtoZnOat400°Candthetotalnitrogencontentdecreaseswiththeincreasingannealingtemperature.Thep-typefilmsareachievedat500℃withalowresistivityof6.33Ω·cmandahighholeconcentrationof+8.82×10~(17)cm~(-3),aswellasalowlevelofcarboncontamination,indicatingthatthesubstitutionalnitrogen(N_O)isaneffectiveacceptorintheZnO:Nfilm.ThephotoluminescencespectrashowclearUVemissionsandalsoindicatethepresenceofoxygenvacancy(V_O)defectsintheZnO:Nfilms.Thep-typedopingmechanismisbrieflydiscussed.
机构地区 不详
出版日期 2016年05月15日(中国期刊网平台首次上网日期,不代表论文的发表时间)
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