学科分类
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1 个结果
  • 简介:MoS_2,MoSe_2andWSe_2thinflakeswerefabricatedbythestandardmicromechanicalcleavageprocedures.ThethicknessandtheopticalcontrastoftheatomicthindichalcogenideflakesonSiO_2/Sisubstratesweremeasuredbyatomicforcemicroscopy(AFM)andspectroscopicellipsometer.Arapidandnondestructivemethodbyusingreflectionspectrawasproposedtoidentifythelayernumberof2DlayeredtransitionmetaldichalcogenidesonSiO_2(275nm)/Sisubstrates.Thecontrastspectraof2DnanosheetswithdifferentlayernumbersareinagreementwiththeoreticalcalculationsbasedonFresnel'slaw,indicatingthatthismethodprovidesanunambiguousandnondestructivecontrastspectrafingerprintforidentifyingsingle-andfew-layeredtransitionmetaldichalcogenides.Theresultswillgreatlyhelpinfundamentalresearchandapplication.

  • 标签: 过渡金属硫化物 指纹识别 二维 层状 无损 原子力显微镜