摘要
MoS_2,MoSe_2andWSe_2thinflakeswerefabricatedbythestandardmicromechanicalcleavageprocedures.ThethicknessandtheopticalcontrastoftheatomicthindichalcogenideflakesonSiO_2/Sisubstratesweremeasuredbyatomicforcemicroscopy(AFM)andspectroscopicellipsometer.Arapidandnondestructivemethodbyusingreflectionspectrawasproposedtoidentifythelayernumberof2DlayeredtransitionmetaldichalcogenidesonSiO_2(275nm)/Sisubstrates.Thecontrastspectraof2DnanosheetswithdifferentlayernumbersareinagreementwiththeoreticalcalculationsbasedonFresnel'slaw,indicatingthatthismethodprovidesanunambiguousandnondestructivecontrastspectrafingerprintforidentifyingsingle-andfew-layeredtransitionmetaldichalcogenides.Theresultswillgreatlyhelpinfundamentalresearchandapplication.
出版日期
2017年09月19日（中国期刊网平台首次上网日期，不代表论文的发表时间）
