摘要
GaNmicrocrystallinegrainsweregrownbyhot-wallchemicalvapordepositiononSi(111)substrate.Thesegrainswithdiametersof2-4μmweredetectedbyscanningelectronmicroscopy.X-raydiffraction,Fouriertransformationinfraredtransmissionspectroscopyandphotoluminescencewereusedtoanalyzethestructure,compositionandtheopticalpropertiesofthesamples.TheresultsshowthatthemicrocrystallinegrainsarehexagonalwurtziteGaN,andthepropertyofthegrainswasgreatlyaffectedbythegrowthtime.
出版日期
2004年03月13日(中国期刊网平台首次上网日期,不代表论文的发表时间)