简介：Whenmeasuringresidualstressofcoarse-grainaluminumalloyusingX-raydiffractionmethod,thediffractionprofileshowstwopeaksandpositionofmeasured2dwillbechanged,whichleadtoaninaccuratemeasurementresult.Hence,inthispaper,somemethodswereemployedtoimprovethemeasurementaccuracy.Duringthemeasuringprocess,differentparameters(diameterofirradiatedarea,Ψ-oscillationrangeandexposuretime)wereselectedandprofilepeakshiftmethodwasutilized.Moreover,whenthe20ofprofileswasdetermined,differentcalculationmethodswereusedtocalculatetheresidualstress.TheresultsshowthatdiameterofirradiatedareaandΨ-oscillationrangehavesignificantinfluenceonthemeasuringresult.Forstressvaluecalculateddirectlyfromthetestequipment,crosscorrelationmethodismoreaccuratethantheabsolutepeak.Furthermore,anothertwocalculationmethodsofslopewith2θ-sin~2Ψande-sin~2Ψwereusedtocalculatethestressbasedonparameters(2θ,ε)obtainedfromcrosscorrelationmethod.Itisconcludedthat20-sin~2Ψmethodcanfurtherimprovethemeasurementaccuracy.