摘要
Anovelfluorescencelifetimeimagingmicroscopy(FLIM)workingwithdeepUV240–280nmwavelengthexcitationshasbeendeveloped.UV-FLIMisusedformeasurementofdefect-relatedfluorescenceanditschangesuponannealingfromfemtosecondlaser-inducedmodificationsinfusedsilica.ThisFLIMtechniquecanbeusedwithmicrofluidicandbiosamplestocharacterizetemporalcharacteristicsoffluorescenceuponUVexcitation,acapabilityeasilyaddedtoastandardmicroscope-basedFLIM.UV-FLIMwastestedtoshowannealingofthedefectsinducedbysilicastructuringwithultrashortlaserpulses.Frequency-domainfluorescencemeasurementswereconvertedintothetimedomaintoextractlongfluorescencelifetimesfromdefectsinsilica.
出版日期
2015年05月15日（中国期刊网平台首次上网日期，不代表论文的发表时间）
